AOI Inspection After Grinding

I. Product Overview

In 2017, as the first-generation AOI (Automated Optical Inspection) system, it employed proprietary visual algorithms that enable precise detection of various defects including panel edge chips, breaks, poor liquid crystal display, uneven acid etching, bumps, dents, and surface scratches. The inspection process boasts high efficiency, with a false positive rate consistently maintained below 10% and a missed detection rate kept within 0.5%.

II. Specification Parameters

III. Performance Characteristics

1. Precise Detection of Micro Defects: Capable of effectively detecting micro defects with diameters as small as 30μm.

2. Customizable Parameter Settings: Relevant parameters for defect detection can be set according to the requirements of the production process.

3. Classified and Summarized Defect Information: Defect information is categorized and summarized based on product IDs, with Excel report output for easy analysis and tracking.